Electrical Engineering Syllabus for GATE 2015 Exams

Category: Engineering Exams, Syllabus 5 0

Electrical Engineering Syllabus for GATE 2015 Exams:

GATE 2015:

The GATE is an acronym that stands for General Aptitude Test for Engineering.

About GATE 2015 Examinations:

The General Aptitude Test for Engineering is an Examination that is conducted on an annual basis across the country. The GATE Exams are conducted for the purposes of admitting all students and candidates to Masters Degree in all the Centralized Universities and Colleges across India.

These examinations are jointly and severally conducted by the Indian Institute of Sciences and all the 7 Indian Institute of Information Technology(IITs).

The examination is conducted mostly in the month of January or February, and the upcoming GATE 2015 examination will also be held in the month of Mid January to February 2015. All the candidates are admitted to the Centralized Universites and Colleges, such as the IITs and the IIs on the basis of the marks or the scores that they obtain from appearing the examination.

The marks/scores of the examination are valid for a period of 2 years from the date of the declaration of the results. The marks and the score are in the form of the All India Rank also called the (AIR), all the admissions to the Universities and the Colleges are on the basis of these marks and scores.

As already said before, the GATE Examinations are held for the purpose of admitting the students/candidates to the post graduation degree/courses, the examinations are conducted in all the 22 streams or disciplines of engineering, click here to see the list http://careersamosa.com/gate-2015-notification/

However, here is the syllabus for Electrical Engineering, one of the papers of the Upcoming GATE 2015 Examinations, click here   Electrical Engineering Syllabus for GATE 2015 Examinations to see the syllabus

Also check out www.careersamosa.com  for more on the upcoming GATE 2015 examinations as well as other Entrance Examinations for the year 2015.

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